Title: Arsenic junction thermal stability and high-dose boron-pocket activation during SPER in nMOS transistors
Authors: Severi, Simone ×
Pawlak, Bartek
Duffy, Ray
Augendre, Emmanuel
Henson, Kirklen
Lindsay, Richard
De Meyer, Christina #
Issue Date: 2007
Series Title: IEEE Electron Device Letters vol:28 issue:3 pages:198-200
ISSN: 0741-3106
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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