|ITEM METADATA RECORD
|Title: ||Arsenic junction thermal stability and high-dose boron-pocket activation during SPER in nMOS transistors|
|Authors: ||Severi, Simone ×|
De Meyer, Christina #
|Issue Date: ||2007 |
|Series Title: ||IEEE Electron Device Letters vol:28 issue:3 pages:198-200|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Associated Section of ESAT - INSYS, Integrated Systems|
× corresponding author|
# (joint) last author|
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