This item still needs to be validated !
|ITEM METADATA RECORD
|Title: ||Processing factors influencing the leakage current in shallow junction diodes for deep submicron CMOS|
|Authors: ||Grau, Lluis ×|
Romano-Rodriguez, A #
|Issue Date: ||2000 |
|Host Document: ||pages:11-14|
|Conference: ||3rd International Conference Materials for Microelectronics; 16-17 October 2000; Dublin, Ireland. location:Leuven Belgium|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||Electrical Engineering - miscellaneous|
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author|
# (joint) last author|
|Files in This Item:
There are no files associated with this item.
Request a copy
All items in Lirias are protected by copyright, with all rights reserved.
© Web of science