Title: Can HBM tester replace 100ns tester ?
Authors: Scholz, Mirko ×
Tremouilles, David
Mahadeva Iyer, Natarajan
Nakaei, T
Hasebe, Takumi
Groeseneken, Guido #
Issue Date: 2006
Conference: EOS/ESD/EMI Workshop location:Leuven Belgium date:18/05/06
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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