ITEM METADATA RECORD
Title: Hot carrier degradation and ESD in submicron CMOS technologies: how do they interact?
Authors: Groeseneken, Guido # ×
Issue Date: 2000
Host Document: pages:276-286
Conference: Proceedings 22nd EOS/ESD Symposium; location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy

 




All items in Lirias are protected by copyright, with all rights reserved.

© Web of science