Title: Impact of temperature and breakdown statistics on reliability predictions for ultra-thin oxides
Authors: Groeseneken, Guido ×
Degraeve, Robin
Kaczer, Ben
Maes, Herman #
Issue Date: 2000
Host Document: pages:295-306
Conference: Structure and Electronic Properties of Ultrathin Dielectrics on Silicon and Related Structures; November 1999; Boston, MA, USA. location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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