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Title: High-k gate stack engineering and low frequency noise performances
Authors: Claeys, Corneel ×
Simoen, Eddy
Srinivasan, Purushothaman
Misra, D #
Issue Date: 2006
Publisher: Electrochem. Soc.
Host Document: pages:287-300
Conference: Dielectrics for Nanosystems II: Materials Science, Processing, Reliability, and Manufacturing location:Leuven Belgium date:07/05/06
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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