Title: Study of the hot-carrier degradation performance of 0.35 ?m fully overlapped LDD devices
Authors: Bellens, Rudi ×
Habas, Predrag
Groeseneken, Guido
Maes, Herman
Mieville, Jean-Paul
Van den bosch, G #
Issue Date: 1995
Series Title: Microelectronic Engineering vol:28 pages:265-268
ISSN: 0167-9317
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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