Title: Analysis and optimisation of the hot-carrier degradation performance of 0.35?m fully overlapped LDD devices
Authors: Bellens, Rudi ×
Habas, Predrag
Groeseneken, Guido
Maes, Herman
Mieville, Jean-Paul
Van den bosch, G
Deferm, Ludo #
Issue Date: 1995
Host Document: pages:254-259
Conference: 33rd Annual IEEE International Reliability Physics Conference; April 4-6, 1995; Las Vegas, NV, USA. location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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