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Title: Dielectric breakdown study of multi-gate devices
Authors: Shickova, Adelina ×
Collaert, Nadine
Rooyackers, Rita
De Keersgieter, An
Kauerauf, Thomas
Jurczak, Malgorzata
Kaczer, Ben
Groeseneken, Guido #
Issue Date: Apr-2006
Publisher: CEA/LETI
Host Document: pages:141-144
Conference: 7th European Workshop Ultimate Integration of Silicon - ULIS location:Leuven Belgium date:20/04/06
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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