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|ITEM METADATA RECORD
|Title: ||Dielectric breakdown study of multi-gate devices|
|Authors: ||Shickova, Adelina ×|
De Keersgieter, An
Groeseneken, Guido #
|Issue Date: ||Apr-2006 |
|Host Document: ||pages:141-144|
|Conference: ||7th European Workshop Ultimate Integration of Silicon - ULIS location:Leuven Belgium date:20/04/06|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||Electrical Engineering - miscellaneous|
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author|
# (joint) last author|
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