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Title: Investigation of the threshold voltage difference between partially-depleted SOI and bulk CMOS transistors
Authors: Van Meer, Hans ×
Lyu, Jeong-Ho
Kubicek, Stefan
De Meyer, Kristin #
Issue Date: 1999
Conference: ESSDERC'99 - Proceedings of the 29th European Solid-State Device Research Conference; 13-15 September 1999; Leuven, Belgium.
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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