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Title: On the impact of indium and boron on the Reversed Narrow-Channel Effects (RNCE) in BULK and SOI MOSFETs
Authors: Van Meer, Hans ×
Lyu, Jeong-Ho
Kubicek, Stefan
De Meyer, Kristin #
Issue Date: 1999
Conference: 1999 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Tevhnical Papers; 8-10 June 1999; Tai
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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