Title: The kinetics of the early stages of electromigration and concurrent temperature induced processes in thin film metallisations studied by means of an in-situ high resolution resistometric technique
Authors: Van Olmen, Jan ×
Manca, Jean
De Ceuninck, Ward
De Schepper, Luc
D'Haeger, V
Witvrouw, Ann
Maex, Karen
Vandevelde, Bart
Beyne, Eric
Tielemans, Luc #
Issue Date: 1999
Series Title: Microelectronics Reliability vol:39 issue:11 pages:1657-1665
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.

© Web of science