Title: Detrimental impact of hydrogen on negative bias temperature instabilities in HfO2-based pMOSFETs
Authors: Houssa, Michel ×
De Gendt, Stefan
Autran, J.L
Groeseneken, Guido
Heyns, Marc #
Issue Date: 2004
Publisher: IEEE
Host Document: pages:212-213
Conference: Symposium on VLSI Technology. Digest of Technical Papers location:Leuven Belgium date:15/06/04
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Molecular Design and Synthesis
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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