Title: Impact of 7.5-MeV proton irradiation on front-back gate coupling effect in ultra thin gate oxide FD-SOI n-MOSFETs
Authors: Hayama, K ×
Takakura, K
Ohyama, H
Rafi, J.M
Mercha, Abdelkarim
Simoen, Eddy
Claeys, Corneel
Kokkoris, M #
Issue Date: 2004
Series Title: IEEE Transactions on Nuclear Science vol:51 issue:6 pages:3795-3800
ISSN: 0018-9499
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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