|ITEM METADATA RECORD
|Title: ||Nanometer profiling of carrier distributions within semiconductor devices|
|Authors: ||Vandervorst, Wilfried|
|Issue Date: ||1999 |
|Conference: ||International Conference on Physics of Surfaces and Interfaces; June 1999; Goteborg, Sweden. location:Leuven Belgium|
|Publication status: ||published|
|KU Leuven publication type: ||DI|
|Appears in Collections:||Electrical Engineering - miscellaneous|
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