Title: Degradation of electrical performance and floating body effect in ultra thin gate oxide FD-SOI n-MOSFETs by 7.5-MeV proton irradiation
Authors: Hayama, K ×
Takakura, K
Ohyama, H
Mercha, Abdelkarim
Simoen, Eddy
Claeys, Corneel
Rafi, J.M
Kokkoris, M #
Issue Date: 2004
Series Title: Microelectronics Reliability vol:44 issue:09/11/07 pages:1721-1726
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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