Title: Lateral distribution of electrons trapped in nitride layers
Authors: Lorenzini, Martino
Rosmeulen, Maarten
Breuil, Laurent
Haspeslagh, Luc
Van Houdt, Jan
De Meyer, Christina
Issue Date: 2004
Conference: MRS Fall Meeting Symposium D: Materials and Processes for Nonvolatile Memories location:Leuven Belgium date:29/11/04
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Electrical Engineering - miscellaneous

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