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Title: Negative bias temperature instabilities in HfSiON/TaN-based pMOSFETs
Authors: Houssa, Michel ×
Aoulaiche, Marc
Van Elshocht, Sven
De Gendt, Stefan
Groeseneken, Guido
Heyns, Marc #
Issue Date: 2004
Publisher: IEEE
Host Document: pages:121-124
Conference: Technical Digest International Electronic Devices Meeting - IEDM location:Leuven Belgium date:13/12/04
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Molecular Design and Synthesis
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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