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Title: Performance and reliability of 0.35µm/0.25µm HIMOS technology for embedded flash memory applications
Authors: Wellekens, Dirk ×
Van Houdt, Jan
Verheyen, Peter
Frisson, Jo
Lorenzini, Martino
Xue, Gang
Maes, Herman #
Issue Date: 1999
Host Document: pages:538-539
Conference: Extended Abstracts of the 1999 International Conference on Solid State Devices and Materials; 21-24 September 1999; Tokyo, Japan location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Physics and Astronomy - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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