|ITEM METADATA RECORD
|Title: ||Highly conductive diamond probes for scanning spreading resistance microscopy|
|Authors: ||Hantschel, Thomas ×|
Vandervorst, Wilfried #
|Issue Date: ||2000 |
|Series Title: ||Applied Physics Letters vol:76 issue:12 pages:1603-1605|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Electrical Engineering - miscellaneous|
× corresponding author|
# (joint) last author|
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