Title: Highly conductive diamond probes for scanning spreading resistance microscopy
Authors: Hantschel, Thomas ×
Niedermann, P
Trenkler, Thomas
Vandervorst, Wilfried #
Issue Date: 2000
Series Title: Applied Physics Letters vol:76 issue:12 pages:1603-1605
ISSN: 0003-6951
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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