ITEM METADATA RECORD
Title: Scanning probes for nanometer scale characterization of semiconductor structures
Authors: Hantschel, Thomas ×
Issue Date: Dec-2000
Publication status: published
KU Leuven publication type: TH
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author

Files in This Item:

There are no files associated with this item.

Request a copy

 




All items in Lirias are protected by copyright, with all rights reserved.