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Title: Radiation source dependence of degradation in shallow trench isolation diodes
Authors: Hayama, Kiyoteru ×
Ohyama, Hidenori
Kobayasi, K
Poyai, Amporn
Simoen, Eddy
Claeys, Cor
Takami, Y
Takizawa, H
Mohammadzadeh, A #
Issue Date: 2000
Host Document: pages:32-35
Conference: Proceedings of the RADECS Workshop - Les Actes des Journees Techniques du RADECS; 11-13 September 2000; Louvain-la-Neuve, Belgiu location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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