Title: Scaling induced drain current degradation for low voltage operation of CMOS technology below 100 nm: impact of non-scalable parameters
Authors: Henson, Kirklen ×
Kubicek, Stefan
De Meyer, Kristin #
Issue Date: 2000
Conference: Proceedings ULIS Workshop; 20-21 January 2000; Grenoble, France. location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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