|ITEM METADATA RECORD
|Title: ||Scaling induced drain current degradation for low voltage operation of CMOS technology below 100 nm: impact of non-scalable parameters|
|Authors: ||Henson, Kirklen ×|
De Meyer, Kristin #
|Issue Date: ||2000 |
|Conference: ||Proceedings ULIS Workshop; 20-21 January 2000; Grenoble, France. location:Leuven Belgium|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||Associated Section of ESAT - INSYS, Integrated Systems|
× corresponding author|
# (joint) last author|
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