Title: Analysis of leakage currents and impact on off-state power consumption for CMOS technology in the 100-nm regime
Authors: Henson, W. K ×
Yang, N
Kubicek, Stefan
Vogel, E. M
Wortman, J
De Meyer, Kristin
Naem, Abdalla #
Issue Date: 2000
Series Title: IEEE Transactions on Electron Devices vol:47 issue:7 pages:1393-1400
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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