Title: Charge trapping in SiOx/ZrO2 gate dielectric stacks
Authors: Houssa, Michel
Naili, Mohamed
Heyns, Marc
Stesmans, André #
Issue Date: 2000
Conference: Proceedings of the International Conference on Solid State Devices and Materials; Sendai, Japan. location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Semiconductor Physics Section
Department of Materials Engineering - miscellaneous
# (joint) last author

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