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Title: Impact of MOSFET oxide breakdown on digital circuit operation and reliability
Authors: Kaczer, Ben ×
Degraeve, Robin
Groeseneken, Guido
Rasras, Mahmoud
Kubicek, Stefan
Vandamme, Ewout
Badenes, Gonçal #
Issue Date: 2000
Host Document: pages:553-556
Conference: IEDM Technical Digest; location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Semiconductor Physics Section
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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