Title: The influence of elevated temperature on degradation and lifetime prediction of thin silicon-dioxide films
Authors: Kaczer, Ben ×
Degraeve, Robin
Pangon, Nadège
Groeseneken, Guido #
Issue Date: 2000
Series Title: IEEE Transactions on Electron Devices vol:47 issue:7 pages:1514-1521
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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