ITEM METADATA RECORD
Title: Combining TOFSIMS with XPS and AFM to quantify organic surface coverages
Authors: Kenens, Conny
Conard, Thierry
Vandervorst, Wilfried
Issue Date: 2000
Conference: Quantitative Surface Analysis-11; 3-7 July 2000; Surrey, UK. location:Leuven Belgium
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Electrical Engineering - miscellaneous

Files in This Item:

There are no files associated with this item.

Request a copy

 




All items in Lirias are protected by copyright, with all rights reserved.