Title: A consistent model for the thickness dependence of intrinsic breakdown in ultra-thin oxides
Authors: Degraeve, Robin ×
Groeseneken, Guido
Bellens, Rudi
Depas, Michel
Maes, Herman #
Issue Date: 1995
Host Document: pages:863-866
Conference: International Electron Devices Meeting. Technical Digest ; 10-13 December 1995; Washington, DC, USA. location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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