Title: Oxide and interface degradation and breakdown under medium and high field injection conditions: a correlation study
Authors: Degraeve, Robin ×
Groeseneken, Guido
De Wolf, Ingrid
Maes, Herman #
Issue Date: 1995
Series Title: Microelectronic Engineering vol:28 issue:01/04/07 pages:313-16
ISSN: 0167-9317
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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