Title: Soft breakdown of ultra-thin gate oxide layers
Authors: Depas, Michel ×
Heyns, Marc
Mertens, Paul #
Issue Date: 1995
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Electron Devices vol:43 issue:9 pages:1499-1504
Conference: ESSDERC '95. Proceedings of the 25th European Solid State Device Research Conference; 25-27 Sept. 1995; The Hague, The Netherlan location:Leuven Belgium
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Clinical Residents Medicine
Department of Materials Engineering - miscellaneous
Surface and Interface Engineered Materials
× corresponding author
# (joint) last author

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