Title: Wear-out of ultra-thin gate oxides during high-field electron tunnelling
Authors: Depas, Michel ×
Vermeire, Bert
Mertens, Paul
Meuris, Marc
Heyns, Marc #
Issue Date: 1995
Series Title: Semiconductor Science and Technology vol:10 issue:6 pages:753-8
ISSN: 0268-1242
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Clinical Residents Medicine
Surface and Interface Engineered Materials
× corresponding author
# (joint) last author

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