IEEE International Reliability Physics Symposium (IRPS), Date: 2020/04/28 - 2020/05/30, Location: ELECTR NETWORK
Publication date:
2020-01-01
ISSN:
978-1-7281-3199-3
Publisher:
IEEE
2020 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS)
Author:
Kruv, A
Kaczer, B ; Grill, A ; Gonzalez, M ; Franco, J ; Linten, D ; Goes, W ; Grasser, T ; De Wolf, I
Keywords:
Science & Technology, Technology, Engineering, Electrical & Electronic, Engineering, Mechanical stress, oxide traps, TDDS, FEM, CIRCUIT