Title: The impact of backside particles on the limits of optical lithography
Authors: Bearda, Twan
Mertens, Paul
Holsteyns, Frank
De Bisschop, Peter
Compen, R
van Meer, R
Heyns, Marc
Issue Date: 2004
Conference: 7th International Symposium on Ultra Clean Processing of Silicon Surfaces - UCPSS location:Leuven Belgium date:20/09/04
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Clinical Residents Medicine

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