|ITEM METADATA RECORD
|Title: ||Steady-state Cs surface concentration on Si and Ge after low energy Cs+ bombardment by SIMS|
|Authors: ||Chen, P ×|
Vandervorst, Wilfried #
|Issue Date: ||Jul-2006 |
|Series Title: ||Applied Surface Science vol:252 issue:19 pages:7239-7242|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Electrical Engineering - miscellaneous|
× corresponding author|
# (joint) last author|
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