Title: Conductive atomic force microscopy studies of thin SiO/sub 2/layer degradation
Authors: Fiorenza, P ×
Polspoel, Wouter
Vandervorst, Wilfried #
Issue Date: Apr-2006
Series Title: Applied Physics Letters vol:88 issue:22
Article number: 222104
ISSN: 0003-6951
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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