|ITEM METADATA RECORD
|Title: ||Depth Resolution and Ripple Formation on AlxGa 1-xAs|
|Authors: ||Elst, Kathy|
|Issue Date: ||1995 |
|Conference: ||10th International Conference on Secondary Ion Mass Spectrometry (SIMS X); October 1-6, 1995; Münster, Germany. location:Leuven Belgium|
|Publication status: ||published|
|KU Leuven publication type: ||DI|
|Appears in Collections:||Electrical Engineering - miscellaneous|
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