Title: Depth Resolution and Ripple Formation on AlxGa 1-xAs
Authors: Elst, Kathy
Tian, Chunsheng
Vandervorst, Wilfried
Adams, F
Issue Date: 1995
Conference: 10th International Conference on Secondary Ion Mass Spectrometry (SIMS X); October 1-6, 1995; Münster, Germany. location:Leuven Belgium
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Electrical Engineering - miscellaneous

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.