Title: Hot hole degradation effects in lateral nDMOS transistors
Authors: Moens, Peter ×
Van den Bosch, Geert
De Keukeleire, Catherine
Degraeve, Robin
Tack, Marnix
Groeseneken, Guido #
Issue Date: Oct-2004
Series Title: IEEE Transactions on Electron Devices vol:2004 issue:51 pages:1704-1710
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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