ITEM METADATA RECORD
Title: Hot hole degradation effects in lateral nDMOS transistors
Authors: Moens, Peter ×
Van den Bosch, Geert
De Keukeleire, Catherine
Degraeve, Robin
Tack, Marnix
Groeseneken, Guido #
Issue Date: Oct-2004
Series Title: IEEE Transactions on Electron Devices vol:2004 issue:51 pages:1704-1710
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy

 




All items in Lirias are protected by copyright, with all rights reserved.

© Web of science