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Title: Charge trapping in metal-ferroelectric-insulator-semiconductor structure with SrBi2Ta2O9/Al2O3/SiO2 stack
Authors: Xu, Zhen ×
Kaczer, Ben
Johnson, Jo
Wouters, Dirk
Groeseneken, Guido #
Issue Date: Aug-2004
Series Title: Journal of Applied Physics vol:96 issue:3 pages:1614-1619
ISSN: 0021-8979
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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