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Title: Characterization of strain in an advanced semiconductor laser structure with nanometer range resolution using a new algorithm for electron diffraction contrast imaging interpretation
Authors: Janssens, Koenraad ×
Van der Biest, Omer
Vanhellemont, Jan
Maes, Herman
Hull, R #
Issue Date: 1995
Series Title: Applied Physics Letters vol:67 issue:11 pages:1530-3
ISSN: 0003-6951
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Physical Metallurgy and Materials Engineering Section (-)
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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