|ITEM METADATA RECORD
|Title: ||SiO2/HfO2 MOSFETs after X-rays irradiation: impact on MOSFET performance and interface degradation|
|Authors: ||Cimino, Salvatore|
|Issue Date: ||2004 |
|Conference: ||Workshop on Radiation on Components and Systems - RADECS location:Padova Italy date:22/09/04|
|Publication status: ||published|
|KU Leuven publication type: ||DI|
|Appears in Collections:||Electrical Engineering - miscellaneous|
ESAT - MICAS, Microelectronics and Sensors
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