Title: SiO2/HfO2 MOSFETs after X-rays irradiation: impact on MOSFET performance and interface degradation
Authors: Cimino, Salvatore
Pantisano, Luigi
Paccagnella, Alessandro
Giubilato, Pietro
Groeseneken, Guido
Issue Date: 2004
Conference: Workshop on Radiation on Components and Systems - RADECS location:Padova Italy date:22/09/04
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors

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