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Title: Bias stress in pentacene transistors measured by four probe transistor structures
Authors: Genoe, Jan
Steudel, Soeren
De Vusser, Stijn
Verlaak, Stijn
Janssen, Dimitri
Heremans, Paul #
Issue Date: 2004
Publisher: IEEE
Host Document: pages:413-416
Conference: Proceedings of the 34th European Solid-State Device Research Conference - ESSDERC location:Leuven Belgium date:21/09/04
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
Electrical Engineering (ESAT) TC, Technology Campus Diepenbeek
Technologiecluster ESAT Elektrotechnische Engineering
# (joint) last author

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