|ITEM METADATA RECORD
|Title: ||Gate-level characterization and reduction of substrate noise in digital integrated circuits|
|Authors: ||Badaroglu, Mustafa|
|Issue Date: ||Sep-2004 |
|Publication status: ||published|
|KU Leuven publication type: ||TH|
|Appears in Collections:||ESAT - MICAS, Microelectronics and Sensors|
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