Title: Influence of gate length on ESD-performance for deep submicron CMOS technology
Authors: Bock, Karlheinz ×
Keppens, Bart
De Heyn, Vincent
Groeseneken, Guido
Ching, L. Y
Naem, Abdalla #
Issue Date: 2001
Series Title: Microelectronics Reliability vol:41 issue:3 pages:375-383
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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