|ITEM METADATA RECORD
|Title: ||Electromigration study of sub-100nm lines|
|Authors: ||Michelon, Julien|
Tio Castro, David
|Issue Date: ||2004 |
|Conference: ||Advanced Metallization Conference location:San Diego, CA, USA date:19/10/04|
|Publication status: ||published|
|KU Leuven publication type: ||DI|
|Appears in Collections:||Associated Section of ESAT - INSYS, Integrated Systems|
|Files in This Item:
There are no files associated with this item.
Request a copy
All items in Lirias are protected by copyright, with all rights reserved.
© Web of science