Title: Extraction of the lightly doped drain concentration of fully depleted SOI NMOSFETs using the back gate bias effect
Authors: Nicolett, A. S ×
Martino, Joao Antonio
Simoen, Eddy
Claeys, Corneel #
Issue Date: 2000
Series Title: Solid-State Electronics vol:44 issue:4 pages:677-684
ISSN: 0038-1101
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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