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Title: A new method to extract the silicon film thickness of enhancement mode fully depleted SOI nMOSFETs at 300K
Authors: Nicolett, A. S
Martino, Joao Antonio
Simoen, Eddy
Claeys, Cor
Issue Date: 2000
Conference: 1st Latin American Test Workshop; March 2000; Rio de Janeiro, Brasil.
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems

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