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Title: Theoretical and experimental study of the front and back interface trap density in accumulation mode SOI MOSFETs at low temperatures
Authors: Martino, Joao Antonio ×
Simoen, Eddy
Claeys, Cor #
Issue Date: 1995
Host Document: pages:271-277
Conference: Proceedings of the Symposium on Low Temperature Electronics and High Temperature Superconductivity; May 21-26, 1995; Reno, NV, U location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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