ITEM METADATA RECORD
Title: Analysis of the early-failure rate prediction of time-dependent dielectric breakdown in thin oxides
Authors: Ogier, Jean-Luc ×
Degraeve, Robin
Roussel, Philippe
Groeseneken, Guido
Maes, Herman #
Issue Date: 1995
Host Document: pages:299-302
Conference: ESSDERC '95. Proceedings of the 25th European Solid State Device Research Conference; 25-27 Sept. 1995; The Hague, The Netherla location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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