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|ITEM METADATA RECORD
|Title: ||Impact of the interfacial layer on the low-frequency noise (1/f) behavior of MOSFETs with advanced gate stacks|
|Authors: ||Crupi, F ×|
Claeys, Corneel #
|Issue Date: ||2006 |
|Publisher: ||Institute of Electrical and Electronics Engineers|
|Series Title: ||IEEE Electron Device Letters vol:27 issue:8 pages:688-691|
|Conference: ||14th Workshop on Dielectrics in Microelectronics WODIM location:I date:26/06/06|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Associated Section of ESAT - INSYS, Integrated Systems|
× corresponding author|
# (joint) last author|
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