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Title: Impact of the interfacial layer on the low-frequency noise (1/f) behavior of MOSFETs with advanced gate stacks
Authors: Crupi, F ×
Srinivasan, Purushothaman
Magnone, P
Simoen, Eddy
Pace, C
Misra, D
Claeys, Corneel #
Issue Date: 2006
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Electron Device Letters vol:27 issue:8 pages:688-691
Conference: 14th Workshop on Dielectrics in Microelectronics – WODIM location:I date:26/06/06
ISSN: 0741-3106
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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